Magneto-transport in tilted magnetic fields
FEATURES | |
---|---|
Local Contact | |
NIJMEGEN | Alix MCCOLLAM, Steffen WIEDMANN, Uli ZEITLER |
Field range | |
NIJMEGEN | 0 ... 38 T |
Angle range | |
NIJMEGEN | ~180 deg |
Temperature range | |
NIJMEGEN | 0.3 ... 30 K (3He system) 1.4 … 380 K (flow cryostat) 0.05 ... 4 K (dilution refrigerator, on request) (Upper temperature limit depends on signal strength) |
Configurations (see Figure) | |
NIJMEGEN | a) rotate field from parallel to perpendicular orientation b) rotate field inside sample plane (azimuthal rotation) c) fixed angle (ϑ=0°), sample perpendicular to field |
Sample size | |
NIJMEGEN | i) sample in LCC-20 chip carrier < 5x5 mm2 (inside LCC-20 dye); ii) sample directly mounted on platform < 10x10 mm2; < 1 mm thickness (typical) |
Sample resistance | |
NIJMEGEN | μΩ … MΩ (AC using lock-in amplifiers) < 1 GΩ (DC, typically, using nanovoltmeters) |
Contact configuration | |
NIJMEGEN | up to 20 contacts for current, voltage and gating |
Bias current | |
NIJMEGEN | < 1 nA …10 mA (typical, depending on sample impedance) |
Gate voltage | |
NIJMEGEN | ±100 V (typical) |
Typical experiment | |
NIJMEGEN | R(B,T,ϑ,Vg,...)
sweep rates (typical) 0.5 … 5 T/min
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Examples | |
NIJMEGEN | Ising superconductivity: PNAS 115, 3551 (2018);Science 350, 1353 (2015); Fractal states in graphene: PNAS 115, 5135 (2018);Quantum Oscillations in ZrSiS: Nature Physics (2017), 178-183; FQHE and Wigner solid in ZnO: arXiv:1707.08406 [cond-mat.mes-hall] ; QHE in InSe: Nat. Nanotechnol. 12, 223 (2017) |
NIJMEGEN |
FEATURES | NIJMEGEN |
---|---|
Local Contact | Alix MCCOLLAM, Steffen WIEDMANN, Uli ZEITLER |
Field range | 0 ... 38 T |
Angle range | ~180 deg |
Temperature range | 0.3 ... 30 K (3He system) 1.4 … 380 K (flow cryostat) 0.05 ... 4 K (dilution refrigerator, on request) (Upper temperature limit depends on signal strength) |
Configurations (see Figure) | a) rotate field from parallel to perpendicular orientation b) rotate field inside sample plane (azimuthal rotation) c) fixed angle (ϑ=0°), sample perpendicular to field |
Sample size | i) sample in LCC-20 chip carrier < 5x5 mm2 (inside LCC-20 dye); ii) sample directly mounted on platform < 10x10 mm2; < 1 mm thickness (typical) |
Sample resistance | μΩ … MΩ (AC using lock-in amplifiers) < 1 GΩ (DC, typically, using nanovoltmeters) |
Contact configuration | up to 20 contacts for current, voltage and gating |
Bias current | < 1 nA …10 mA (typical, depending on sample impedance) |
Gate voltage | ±100 V (typical) |
Typical experiment | R(B,T,ϑ,Vg,...)
sweep rates (typical) 0.5 … 5 T/min
![]() |
Examples | Ising superconductivity: PNAS 115, 3551 (2018);Science 350, 1353 (2015); Fractal states in graphene: PNAS 115, 5135 (2018);Quantum Oscillations in ZrSiS: Nature Physics (2017), 178-183; FQHE and Wigner solid in ZnO: arXiv:1707.08406 [cond-mat.mes-hall] ; QHE in InSe: Nat. Nanotechnol. 12, 223 (2017) |